Advanced Processing and Characterization Technologies

Advanced Processing and Characterization Technologies

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Fabrication and Characterization of Semiconductor Optoelectronic Devices and Integrated Circuits, Clearwater, FL, 1991 ... Effect of Window Diffusion Stripe Structure on Reduction of Temperature Rise at Laser Facet Aklhlro Shlma, Yoshihiro Kokubo and Masao Alga Optoelectronic aamp; Microwave Devices Raamp;D Laboratory Mitsubishi Electric Corporation 4-1, Mizuhara, Itami ... Figure 1 shows a schematic diagram of the system for the measurement of the temperature at the laser mirror.

Title:Advanced Processing and Characterization Technologies
Author: Paul H. Holloway
Publisher:Amer Inst of Physics - 1991

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